AZOM

History of FIB Sample Preparation for TEM Analysis

When thinking of celebrated technological innovations, it is perhaps rare that we consider the role of material scientists: the unsung heroes of advancement. Nonetheless, it is the great work of these ...
AZOM

Laser Ablation for Site-Specific TEM Sample Preparation in a FIB-SEM

This article examines the use of femtosecond (fs) laser ablation for site-specific TEM sample preparation in a FIB-SEM. Various workflows are shown facilitating TEM lamella preparation of regions of ...
AZoNano

Combining Flexibility and Automation in FIB-SEM for TEM Lamella Preparation

Thought LeadersProf. Dariusz Jarzabek & Martina SchenkelProfessor & Applications Development EngineerInstitute of Fundamental Technological Research & ZEISS In this interview, AZoNano speaks with ...
Michigan Technological University

FIB Holder Types

This holder is used in the final steps of TEM specimen preparation. The lifted portion of the bulk specimen is placed onto a special TEM grid. The special grid should be oriented in the holder with ...
University of Wyoming

Wind River: FIB-SEM

CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...
AZoNano

Sample Characterization with High Current Plasma FIB-SEM

In this interview, we speak to Martin Slama at TESCAN, who describes sample preparation using high current plasma FIB SEM. Can you describe what high current plasma FIB-SEM is? The high current plasma ...
Michigan Technological University

FIB Preparation Options

In the single-beam FIB, such as our Hitachi FB-2000A FIB, some milling will occur during observation of the specimen. Surface features, such as thin films, can be milled away during this process. In ...